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memsstar Receives Multiple MEMS Etch R&D System Orders in Asia; Sells First memsstar® Systems in Korea and India

LIVINGSTON, Scotland ­ January 29, 2013 -- memsstar Limited, a leading provider of etch and deposition equipment and technology solutions to manufacturers of semiconductors and micro-electrical mechanical systems (MEMS), today announced two strategic etch system order wins from new MEMS customers in Asia.

MEMS Industry Group Announces MEMS Executive Congress Europe 2013

Executive conference examines MEMS’ connection to European advancements in consumer, automotive, energy, medical

Honeywell Introduces 6 Degrees of Freedom Inertial Measurement Unit, 6-D Motion Variant

6-Dimensional Motion Sensor Enables Precise Control and Increases Accuracy, Stability, Safety, and Operator Productivity

MINNEAPOLIS, Jan. 15, 2013 – Honeywell (NYSE:HON) announced today it has introduced its Inertial Measurement Unit (IMU), 6-D Motion Variant, 6DF Series, designed to provide motion, position, and navigational sensing from a durable single device over six degrees of freedom.

MEMS Is Changing The Game – Plus The Tablet, Handset And Future Of Consumer Electronics

MEMS Industry Group’s 2013 CES MEMS TechZone Shows Consumers What’s Next

PITTSBURGH—December 18, 2012—MEMS Industry Group (MIG), a global industry organization with close to 150 member-companies and partners, today announced a line-up of suppliers, partners and end-user companies, all participating in MEMS TechZone, its show-floor experience at the 2013 International CES.

MEMS, the Cornerstone of Intelligent Connected Devices: Key Theme at MEMS Executive Congress US 2012

MEMS Suppliers and OEMs explore trends, technologies and market influences at MEMS Industry Group’s flagship business conference

MEMS Testing and Reliability 2012 - Conference and Exhibition (Santa Clara)

MEMS Testing and Reliability 2012 - Conference and Exhibition (Santa Clara)
When: 
Oct 18 2012 - 8:00am

MEMS Journal and MEPTEC Present
MEMS Testing and Reliability 2012
4th Annual Conference on MEMS Testing and Reliability
Thursday, October 18, 2012
8AM - 6PM
Biltmore Hotel & Suites
Santa Clara, California
Conference Topics
Who Should Attend
Hotel Information
Contact Information
Testimonials
Registration

GSA Announces MEMS Working Group Chair

STMicroelectronics MEMS Product Marketing Manager to lead Working Group

Imec demonstrates CMOS integrated poly-SiGe piezoresistive pressure sensor

Leuven (Belgium) – October 10, 2011 – Imec realized an integrated poly-SiGe-based piezoresistive pressure sensor directly fabricated above 0.13 µm copper (Cu) -backend CMOS technology. This represents not only the first integrated poly-SiGe pressure sensor directly fabricated above its readout circuit, but also the first time that a poly-SiGe MEMS device is processed on top of Cu-backend CMOS.

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