New solutions enable advancement of cell and battery technologies, electrical powertrain components, and sub-systems used in hybrid and electric vehicles, and in associated energy storage units
• High-power/high-voltage power converter test solution—enables safe and
effective testing of power converters and on-board charging sub-systems
(CAMBRIDGE, MA) -- Researchers at MIT have found a way to detect early-stage malarial infection of blood cells by measuring changes in the infected cells’ electrical properties.
20 August 2013 - Munich, Germany and Westford, MA, USA - Zuken, a leader in electronic systems design, today announces the latest release of its CR-5000 enterprise PCB design software.
With our digital world growing more complex, the systems recording physical and electrical phenomenon need to meet new acquisition and logging challenges.
Cadence Accelerates Litho, CMP and LDE Analysis Design-for-Manufacturing Flows for UMC Customers
HIGHLIGHTS:
• New flows incorporate the industry's leading DFM prevention, analysis, and signoff capabilities
• Cadence technologies selected after extensive benchmark testing
• DFM solutions to boost productivity and enhance yield for customers
WILSONVILLE, Ore., July 16, 2013—Mentor Graphics Corporation (NASDAQ: MENT) today announced that the leading provider of zero-emission commercial transit solutions, Proterra Inc., has standardized on the Mentor Graphics® VeSys® tools for its electrical systems design and manufacture of wire harnesses.
SAN JOSE, Calif., June 5, 2013 /PRNewswire/ -- GainSpan® Corporation, a leader in ultra-low power Wi-Fi connectivity for the Internet of Things, has introduced the Smartplug Application Development Kit (ADK) that allows developers to quickly and easily add Wi-Fi connectivity to a regular plug or power strip and control and monitor electrical loads using a PC or an iOS or Android based smartphone.
New tool detects electrical issues and small physical defects; helps optimize high-speed optical wafer inspection systems for preferential capture of yield-relevant defects