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Old 04-22-2009, 08:03 AM
RF DesignLine
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Default Wireless test; Automated test; Counterfeit components; "all-up" testing; and more

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RF DesignLine Newsletter
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The RF DesignLine Newsletter is delivered to you
free of charge from the staff of RF DesignLine.
To view the RF DesignLine visit:
http://newsletter.designlinenetwork....rT0QTC0EtYM0EJ

04-22-2009

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This issued sponsored by IEEE MTT-S Intl Microwave Symposium

The premier microwave and RF conference and exhibition is coming to
Boston. Wireless, Radar, RF, high frequency semiconductors,
electromagnetics, com/mil RF, microwave and mm-wave electronics and
applications. Register by May 15 and Save 25%. June 7-12, 2009.
Learn more: http://newsletter.designlinenetwork....rT0QTC0HEqf0EO
~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~
EDITOR'S NOTE

--Kind of a strange week here, with relatively few new products. It
could be just a random thing, a trough caused by the overlap of the
absence of new-product releases. My mental model is that the aggregate
quantity of new product releases is due to the constructive and
destructive interference from a multitude of unsynchronized
product-release "waveforms" from different vendors, all with different
periods. (I am sure there is a grant opportunity here, to analyze this
theory further.)

Or, it could be phenomena I have noticed before: when there is a big
show/conference coming, everyone is working towards announcing
products either immediately before, or at, the event, and thus things
are quiet up until several weeks prior. In this case, it is the 2009
International Microwave Symposium, June 7-12, in Boston, informally
and commonly known as the MTT-S show, since it is under the aegis of
the IEEE Microwave Theory and Techniques Society. Details are at
http://newsletter.designlinenetwork....rT0QTC0HEqf0EO

But the lack of new products doesn't mean we don’t have technical
articles--we do. We look at test challenges for emerging wireless
design; at automated testing and simulation, and the nasty problem of
recognizing counterfeit components, a very difficult and aggravating
issue. It is one thing when a fake component means your product fails
final test, but it's far worse when you start having field failures
due to poor-quality counterfeit capacitors or resistors, for example,
which would not have caused the product to fail final test, in most
cases, but show up later due to heat, vibration, and just being out
there in use.

--Speaking of test, one of the bigger issues facing designers of
today's systems is verifying proper operation at the system level. You
can define, design, and test individual subsystems and boards, but
it's a real challenge verifying that the complete system plays
together and process correct results. I am always interested in test
units which provide that so-called "all up" verification. Too often,
every subsystem works to its target spec, but the overall system falls
short or has strange anomalies. That's why test systems for 3G and 4G
performance, or GPS systems, are extremely important (and expensive).

As we add more complex functions into systems, these tests are more
important than ever. Just a few weeks ago, for example, Agilent
Technologies Inc introduced their A-GPS Design Verification Test
System. (A-GPS is an enhanced position-location method that uses
precise positioning assistance data obtained from base stations
constantly monitoring GPS satellites to enable faster position
location.) Quoting from the press release, "Agilent's 8960 test set
addresses this requirement by acting as a base station with an A-GPS
message pipe for sending A-GPS assistance data messaging to and from
the wireless device or phone under test." My question is this: without
this sort of test set, how can an end-product vendor do a credible job
of verifying this function?

--The problem of system test is not new, of course. I'll quote from
one of my favorite books about the engineering of the Apollo program,
"Apollo: The Race to the Moon" by Charles Murray and Catherine Bly
Cox. In a "step back" chapter, they write: "This business of testing
one stage of a rocket at a time. . . .didn't accomplish what people
thought it did. You really didn't build brick by brick anymore; all
that did was to waste time. Whenever you added a new stage, the ground
support equipment was different, the checkout procedures were
different, the countdown was different, the hardware was different."
Of course, you should test each module or functional block or PCB on
its own, but that is not enough by any means. Of course, an
all-electronic system is not a rocket, but there are still many
initialization, interface, and other issues that change as you build
up the entire system.

That's it for now.

Bill Schweber, Site Editor, RF DesignLine
bschweber (AT) techinsights (DOT) com
P.S. Don't forget to check out the new links to articles from other
publications that may interest you, at the end.

TECHNICAL ARTICLES

--Resolving test challenges for emerging wireless designs--

Understand some of the issues which impact testing of mixed-signal and
RF packages

http://newsletter.designlinenetwork....rT0QTC0HGlr0EX

--What you need to know about automated testing and simulation--

An overview of automated hardware and software testing and simulation
and how to use they can be used together to improve testing speed,
test coverage and the ability to test before hardware becomes
available.

http://newsletter.designlinenetwork....rT0QTC0HGls0EY

--Spot and void counterfeit component bombs--

The proliferation of counterfeit components is a plague, the cost of
which is staggering: from failed devices and the associated recalls to
destroyed reputations of the original parts designers and suppliers.
This feature shows how to spot and avoid those lurking counterfeit
bombs.

http://newsletter.designlinenetwork....rT0QTC0HGlt0EZ

--RF in Action: Mobile Phones on the High Seas--

There are no network towers in the middle of oceans. There are no
phone lines trailing the international cruise ships that dot large
waterways. But there are thousands of tourists making long-distance
cruises every year.

http://newsletter.designlinenetwork....rT0QTC0HGJA0EA

--RFID: Track, Trace Crime Scene Evidence--

Evidence is collected and packed at the crime scene, and then sent to
Netherlands Forensic Institute for analysis. All materials are tagged
using a smart label.

http://newsletter.designlinenetwork....rT0QTC0HGJB0EB

--Power Reduction Techniques in Mixed-Signal Integrated Circuits:
Practical Approaches--

IDT authors discuss the trade-offs and considerations for obtaining
the lowest power in various cases.

http://newsletter.designlinenetwork....rT0QTC0HGJC0EC

PRODUCTS

--Microchip introduces high-speed 45 nS comparators--

Rail-to-rail I/O, low operating voltages make Microchip's MCP656X
comparators suitable for battery-powered applications.

http://newsletter.designlinenetwork....rT0QTC0HGJD0ED

--Dual RF LDMOS bias controllers offer integration, reduce cost with
power savings--

At 7mm x 7mm, Maxim says its latest devices are the industry's
smallest LDMOS bias controllers to integrate all of the
analog-to-digital and digital-to-analog interfaces and logic functions
required for cellular base-station control.

http://newsletter.designlinenetwork....rT0QTC0HGJE0EE

--13.5-16 GHz GaAs MMIC PA delivers 10W output power--

Mimx Broadband's dual-sided bias amplifier achieves 17 dB gain and +48
dBm OIP3.

http://newsletter.designlinenetwork....rT0QTC0HGJF0EF

--GaAs MMIC SP8T switch streamlines mobile phone design --

NEC's UPG2193T6E SP8T GaAs MMIC antenna switch meets the needs of new
3G UMTS, W-CDMA and Quad Band EDGE mobile phone designs.

http://newsletter.designlinenetwork....rT0QTC0HFlp0EU

--SiTime enters VCXO market with MEMS-based device --

SiTime's voltage controlled MEMS oscillator features 0.5% pull range
linearity, small size and flexibility through programmability.

http://newsletter.designlinenetwork....rT0QTC0HFlq0EV

--Wi-Fi sensor networking module has 5-year battery life--

RF Monolithics' 2.4 GHz IEEE 802.11 g radio transceiver module enables
OEMs to build low-power WLAN and sensor monitoring solutions for the
global market.

http://newsletter.designlinenetwork....rT0QTC0HFlr0EW

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NEWS

--Diatoms could triple solar cell efficiency--

Microscopic algae called diatoms could help triple the electrical
output of experimental, dye-sensitized solar cells, according to
researchers.

http://newsletter.designlinenetwork....rT0QTC0HGlu0Ea

--MIT researchers claim novel pattern exposure --

Massachusetts Institute of Technology researchers claim to have made a
breakthrough allowing the production of nano-scale patterns much
smaller than the wavelength of light used to expose them.

http://newsletter.designlinenetwork....rT0QTC0HGlv0Eb

--Linear Tech hits guidance, cuts 130 jobs--

Linear Technology said it reduced its workforce by about 130 jobs
after a fiscal third quarter in which revenue was $200.9 million, down
19 percent sequentially and 33 percent year-to-year, but within range
of previous company guidance.

http://newsletter.designlinenetwork....rT0QTC0HGlw0Ec

--Synthetic diamond could be quantum computer's best friend--

Researchers have claimed significant progress in the development of
synthetic diamond suitable for the realization of quantum computers
capable of operating at room temperature.

http://newsletter.designlinenetwork....rT0QTC0HGJH0EH

--Transparent displays create new uses for windows --

A team of researchers is developing technologies that aim at making
transparent screens usable as displays. Prototypes will be shown at
the Hannover Industry fair.

http://newsletter.designlinenetwork....rT0QTC0HGJI0EI

--Spec-compliant RF remote controls emerge --

The first RF remote controls adhering to the emerging Radio
Frequencies for Consumer Electronics standard were demonstrated at the
cable industry's annual show.

http://newsletter.designlinenetwork....rT0QTC0HGJJ0EJ

VIEWPOINT

--Getting some basic RF experience--

The best way to learn RF circuits is to build some basic ones, but
where to start?

http://newsletter.designlinenetwork....rT0QTC0HGlx0Ed

--Thinking Optics vs RF--

Don't waste you time at the supermarket checkout line looking at the
celebrity publications; instead, exercise your brain with some
semi-philosophical thought questions

http://newsletter.designlinenetwork....rT0QTC0HGJK0EK

--IBM Fellow: Moore's Law defunct--

An IBM researcher says Moore's Law is running out of gas.

http://newsletter.designlinenetwork....rT0QTC0HGJL0EL

MOST POPULAR ARTICLES OF THE WEEK

--Wireless triangulation using RSSI signals--

Understand how a received signal strength indicator, combined with a
networked quartet of transceivers and antennas, can pinpoint a
transmitter's location

http://newsletter.designlinenetwork....rT0QTC0HFLW0EX

--RF in Action: Consumer remote controls --

Say hello to RF-controlled devices. Radio technology is faster, more
reliable and almost as inexpensive as infrared.

http://newsletter.designlinenetwork....rT0QTC0HFLV0EW

--Choosing between pipeline vs. sigma delta ADCs for communications
applications--

Each analog/digital architecture has its place, depending on required
performance specifications

http://newsletter.designlinenetwork....rT0QTC0HFlo0ET

AROUND THE WEB
Here are some interesting technical articles recently seen in other
publications:
--Rather than use the simple rule of thumb of including the 5th
harmonic, we should use rise/fall time to determine the bandwidth
required to measure a high-speed digital signal:
"Is the 5th Harmonic Still Useful for Predicting Data Signal
Bandwidth?," High Frequency Electronics, January 2009
http://newsletter.designlinenetwork....rT0QTC0HGly0Ee
--Description of a basic test instrumentation setup and calibration
procedure used for noise parameter measurement:
"Understanding Noise Parameter Measurement," Microwave Journal,
February 2009
http://newsletter.designlinenetwork....rT0QTC0HGlz0Ef
--Understanding phase noise in oscillators and synthesizers makes it
easier when comparing the performance of different sources at
different frequencies:
"Know the Nuances Of SSB Phase Noise," Microwaves & RF, February 2009
http://newsletter.designlinenetwork....rT0QTC0HGl10ES

~~~~~~~~~~~~~~~~~~~ NOW HIRING ~~~~~~~~~~~~~~~~~~~

Electronics Group Now Hiring 04/17/09

P and H Mining Equipment seeking Elctrical Systems Integration in
Milwaukee, WI
http://newsletter.designlinenetwork....rT0QTC0HGjk0EO

D. E. Shaw Research seeking Chief of Staff in New York, NY
http://newsletter.designlinenetwork....rT0QTC0HFir0ET

Osram Sylvania seeking Senior Quality Engineer in York, PA
http://newsletter.designlinenetwork....rT0QTC0HGjl0EP

SDL seeking Research Scientist in Cincinnati, OH
http://newsletter.designlinenetwork....rT0QTC0HGjm0EQ

SEL seeking Test Engineer in Pullman, WA
http://newsletter.designlinenetwork....rT0QTC0HGjn0ER

For more great jobs, career-related news, features and services,
please visit EETimesCareers.
http://newsletter.designlinenetwork....rT0QTC0EfwY0El
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~~~~~~~~~~~~~~~Around the Network Events~~~~~~~~~~~~~~~~~~

View Our Full List of Newsletters Here!
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http://newsletter.designlinenetwork....rT0QTC0E2Pd0ER

Upcoming Conferences & Events:
http://newsletter.designlinenetwork....rT0QTC0BjCO0Ek

Electronics Event Listings:
http://newsletter.designlinenetwork....rT0QTC0DQwv0Es

EE Times Vendor Sponsored Product Information:
http://newsletter.designlinenetwork....rT0QTC0CtAi0EL

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