WP224 - Negative-Bias Temperature Instability (NBTI) Effects in 90 nm PMOS

Submitted by fpgawhitepaper on September 13, 2008 - 11:08pm

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This paper describes Negative-Bias Temperature also describes how Xilinx has proactively addressed this challenging behavior.

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Click here to download the Whitepaper on - WP224 - Negative-Bias Temperature Instability (NBTI) Effects in 90 nm PMOS

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