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Digital Wireless Test Revolution as Illustrated by DigRF V3
Baseband I and Q is transforming from analog to digital. Your world as a baseband or RF designer is changing dramatically as a result of this trend. In this webcast, Agilent will illustrate the future of test and measurement cross-domain solutions for RF and BaseBand IC teams, based on DigRF V3 for mobile handsets.
Who should attend:
This webcast will be valuable to designers of wireless appliances that implement I and Q vector modulation, such as mobile handsets. Especially helpful for members of RF and BaseBAnd IC teams working on DigRF V3, MIPI, OBSAI, or WiMAX™.
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