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International Symposium on VLSI Design Automation and Test (VLSI-DAT 2008) - Hsinchu, Taiwan

When: 
Apr 23 2008 - 4:00pm - Apr 25 2008 - 11:30pm
Where: 
Ambassador Hotel Hsinchu

The conference program will cover a half-day tutorial and 2.5 days technical sessions including a plenary session and an invited industrial session. A number of invited speakers will share their up-to-date research results.
The conference is proud to create a platform for technical exchanges and communications shared by experts from all over the world. The purpose is to bring together scientists and engineers actively engaged in research, development, and manufacturing on VLSI Design, Automation and test to discuss current progress in this field.

Time Apr.
23, Wednesday
 
Ballroom
B
 
9:00 ~ 9:20 Opening
9:20 ~ 12:10 Plenary
Session : Keynote Speeches
12:10 ~ 13:30 Lunch
  Ballroom
A
Ballroom
B
13:30 ~ 15:00

Session W1A
:
Physical
Design Optimization

Industry Session
:

Solutions for advanced SoC/IP - design, testing, and power estimation

15:00 ~ 15:20

Break

15:20 ~ 17:00 Session W2A :
LNA
and Receiver
Industry Session
:

Solutions for advanced SoC/IP - design, testing, and power estimation

18:00 ~ 20:00 DAT
Cocktail Reception (Ballroom D)
Time Apr.
24, Thursday
 
Ballroom
A
Ballroom
B
Ballroom
C
9:00 ~ 10:30 Session T1A :
Video
System IC Design
Session T1B :
Testing/DFT
(I)
 
10:30 ~ 10:50 Break 10:30
~ 13:30
Poster
Session
10:50 ~ 12:30 Session T2A :
Digital
Circuit
Session T2B :

Testing/DFT
(II)

12:30 ~ 13:30 Lunch
13:30 ~ 15:10 Session T3A :
PLL
& CDR
Session T3B :
SoC
Design & Methodology
 
15:10 ~ 15:30 Break
15:30 ~ 17:10 Session T4A :

Analog
Tech. & Front-end

Session T4B :
High
Level Synthesis and Logic Synthesis for Power & Area Optimization
Time Apr.
25, Friday
 
Ballroom
A
Ballroom
B
Ballroom C
9:00 ~ 10:30 Session F1A :
ADC and Analog Design
Session F1B :

Communication IC Design

 
10:30 ~ 10:50 Break
10:50 ~ 12:30 Session F2A :
Filter & Power Divider
Session F2B :
Error Correction IP Design
12:30 ~ 13:30 Lunch
13:30 ~ 16:30 Tutorial I (Ballroom A) :
ESL Standards and Design Methodology
Tutorial II (Ballroom B) :

Testing & Debugging of Circuit Marginality Problems

Tutorial III (Ballroom C)
:
CMOS Microwave and Millimeter-wave Circuit Designs

 

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